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1

Nano and Micro Unmanned Aerial Vehicles (UAVs): A New Grand Challenge for Precision Agriculture?

Gago, Jorge, Estrany, Joan, Estes, Lyndon, Fernie, Alisdair R., Alorda, Bartomeu, Brotman, Yariv, Flexas, Jaume, Escalona, JosÃ© Mariano, Medrano, HipÃ³lito

Journal:

Current Protocols in Plant Biology

Year:

2020

File:

PDF, 3.06 MB

2020

2

8T vs. 6T SRAM cell radiation robustness: A comparative analysis

Bartomeu Alorda, Gabriel Torrens, Sebastià Bota, Jaume Segura

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 1.28 MB

english, 2011

3

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Analysis of radiation-hardening techniques for 6T SRAMs with structured layouts

Torrens, Gabriel, Alorda, Bartomeu, Bota, Sebastia, Segura, Jaume

Year:

2009

Language:

english

File:

PDF, 457 KB

english, 2009

4

Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells

Alorda, Bartomeu, Torrens, Gabriel, Bota, Sebastia, Segura, Jaume

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.69 MB

english, 2014

5

An Experimental Approach to Accurate Alpha-SER Modeling and Optimization Through Design Parameters in 6T SRAM Cells for Deep-Nanometer CMOS

Torrens, Gabriel, Bota, Sebastia A., Alorda, Bartomeu, Segura, Jaume

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 1.03 MB

english, 2014

6

[IEEE 2014 24th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) - Palma de Mallorca, Spain (2014.9.29-2014.10.1)] 2014 24th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) - Energy consumption savings in ZigBee-based WSN adjusting power transmission at application layer

Carmona, C., Alorda, B., Ribot, M. A.

Year:

2014

Language:

english

File:

PDF, 2.35 MB

english, 2014

7

An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies

Alorda, Bartomeu, Carmona, Cristian, Torrens, Gabriel, Bota, Sebastia

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 2.51 MB

english, 2016

8

A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors

Torrens, G., Alorda, B., Carmona, C., Malagon-Perianez, D., Segura, J., A. Bota, S.

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2017

Language:

english

File:

PDF, 2.04 MB

english, 2017

9

The phytoestrogen genistein affects inflammatory-related genes expression depending on the ERα/ERβ ratio in breast cancer cells

Pons, Daniel Gabriel, Vilanova-Llompart, Joana, Gaya-Bover, Auba, Alorda-Clara, Marina, Oliver, Jordi, Roca, Pilar, Sastre-Serra, Jorge

Journal:

International Journal of Food Sciences and Nutrition

Year:

2019

Language:

english

File:

PDF, 1.56 MB

english, 2019

10

[IEEE 2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS) - Nis, Serbia (2019.10.23-2019.10.25)] 2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS) - Energy Consumption Analysis in Adaptive Wireless Sensor Networks

Alorda, B., Ribot, M.A.

Year:

2019

File:

PDF, 784 KB

2019

11

[IEEE 2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS) - Nis, Serbia (2019.10.23-2019.10.25)] 2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS) - Dual Band Power Amplifier Linearization

Atanaskovic, Aleksandar, Doric, Aleksandra, Alorda, Bartomeu, Males-Ilic, Natasa

Year:

2019

File:

PDF, 930 KB

2019

12

[IEEE 2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS) - Nis, Serbia (2019.10.23-2019.10.25)] 2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS) - Linearization of Doherty Amplifier by Injection of Digitally Processed Baseband Signals at the Output of the Main and Auxiliary Cell

Doric, Aleksandra, Atanaskovic, Aleksandar, Alorda, Bartomeu, Males-Ilic, Natasa

Year:

2019

Language:

english

File:

PDF, 6.06 MB

english, 2019

13

Transistor width effect on the power supply voltage dependence of alpha-SER in CMOS 6T SRAM

Torrens, G., Alheyasat, A., Alorda, B., Barcelo, S., Segura, J., Bota, S.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2020

File:

PDF, 1.58 MB

2020

14

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Bit-Cell Selection Analysis for Embedded SRAM-Based PUF

Alheyasat, A., Torrens, G., Bota, S., Alorda, B.

Year:

2020

File:

PDF, 386 KB

2020

15

Influence of weather types on the hydrosedimentary response in three small catchments on the Island of Mallorca, Spain

PeÃ±a-Angulo, Dhais, Estrany, Joan, GarcÃa-Comendador, JuliÃ¡n, Fortesa, Josep, TomÃ s-Burguera, Miquel, Company, Jaume, Alorda, Bartomeu, Nadal-Romero, Estela

Journal:

Environmental Research

Year:

2021

File:

PDF, 287 KB

2021

16

A Two-Level Power-Grid Model for Transient Current Testing Evaluation

B. Alorda, V. Canals, J. Segura

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 322 KB

english, 2004

17

Low spatial frequency filtering modulates early brain processing of affective complex pictures

Catalina Alorda, Ignacio Serrano-Pedraza, J. Javier Campos-Bueno, Vicente Sierra-Vázquez, Pedro Montoya

Journal:

Neuropsychologia

Year:

2007

Language:

english

File:

PDF, 1.35 MB

english, 2007

18

Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination

Torrens, G., Alorda, B., Barcelo, S., Rossello, J.L., Bota, S.A., Segura, J.

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2010

Language:

english

File:

PDF, 547 KB

english, 2010

19

Design and evaluation of a microprocessor course combining three cooperative methods: SDLA, PjBL and CnBL

B. Alorda, K. Suenaga, P. Pons

Journal:

Computers & Education

Year:

2011

Language:

english

File:

PDF, 469 KB

english, 2011

20

Necesidades de las cuidadoras familiares de personas con accidente cerebrovascular en el domicilio: Revisión estructurada 2000–2007

M.C. Vidal-Thomàs, C. Alorda-Terrasa, R.M. Adrover-Barceló, J. Ripoll-Amengual, J.M. Taltavull-Aparicio, A. Sáenz de Ormijana-Hernández

Journal:

Enfermería Clínica

Year:

2009

File:

PDF, 213 KB

2009

21

Disnea y psicopatología en el paciente anciano con enfermedad pulmonar obstructiva crónica

María Magdalena Medinas Amorós, Carmen Más Tous, Victoria Ferrer Pérez, Belén Martín López, Catalina Alorda Quetglas, Feliu Renom Sotorra

Journal:

Revista Española de Geriatría y Gerontología

Year:

2011

File:

PDF, 308 KB

2011

22

Planificación enfermera ante una persona con falta de autonomía. Estudio de un caso

Rosa Miró Bonet, Margalida Miró Bonet, Gloria Gallego Caminero, Carmen Terrassa Alorda

Journal:

Enfermería Clínica

Year:

2005

File:

PDF, 72 KB

2005

23

Ansiedad durante el proceso de destete. Estudio de un caso

Margalida Miró-Bonet, Gloria Gallego-Caminero, Carmen Alorda-Terrassa, Rosa Miró-Bonet

Journal:

Enfermería Clínica

Year:

2006

File:

PDF, 70 KB

2006

24

Seguimiento de un caso clínico en hospitalización a domicilio: una nueva alternativa

Gloria Gallego Caminero, Carmen Alorda Terrassa, Rosa Miró Bonet, Margalida Miró Bonet

Journal:

Enfermería Clínica

Year:

2008

File:

PDF, 110 KB

2008

25

Charge-based testing BIST for embedded memories

Alorda, B., de Paul, I., Segura, J.

Journal:

IET Computers & Digital Techniques

Year:

2007

Language:

english

File:

PDF, 852 KB

english, 2007

26

Stress associated with hospitalization in patients with COPD: the role of social support and health related quality of life

Magdalena Medinas-Amorós, Juan José Montaño-Moreno, Maria José Centeno-Flores, Victoria Ferrer-Pérez, Feliu Renom-Sotorra, Belen Martín-López, Catalina Alorda-Quetglas

Journal:

Multidisciplinary Respiratory Medicine

Year:

2012

Language:

english

File:

PDF, 183 KB

english, 2012

27

Quality of life in patients with chronic obstructive pulmonary disease: the predictive validity of the BODE index

Medinas-Amoros, M., Alorda, C., Renom, F., Rubi, M., Centeno, J., Ferrer, V., Gorriz, T., Mas-Tous, C., Ramis, F.

Journal:

Chronic Respiratory Disease

Year:

2008

Language:

english

File:

PDF, 181 KB

english, 2008

28

SRAM Alpha-SER Estimation From Word-Line Voltage Margin Measurements: Design Architecture and Experimental Results

Torrens, G., Paul, I. de, Alorda, B., Bota, S., Segura, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.01 MB

english, 2014

29

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Charge based transient current testing (CBT) for submicron CMOS SRAMs

Alorda, B., Rosales, M., Soden, J., Hawkins, C., Segura, J.

Year:

2002

Language:

english

File:

PDF, 445 KB

english, 2002

30

[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - A non-intrusive built-in sensor for transient current testing of digital VLSI circuits

Alorda, B., Bota, S., Segura, J.

Year:

2005

Language:

english

File:

PDF, 333 KB

english, 2005

31

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Accurate alpha soft error rate evaluation in SRAM memories

Bota, S. A., Torrens, G., de Paul, I., Alorda, B., Segura, L. A.

Year:

2013

File:

PDF, 382 KB

2013

32

[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories

Bota, S. A., Torrens, G., Alorda, B., Verd, J., Segura, J.

Year:

2010

Language:

english

File:

PDF, 313 KB

english, 2010

33

[IEEE IEEE EDUCON 2010 Conference - Madrid, Spain (2010.04.14-2010.04.16)] IEEE EDUCON 2010 Conference - enginy@eps: Motivating the engineering courses: Social valuation as a motivating factor

Alorda, B., Verd, J., Burguera, A., Guerrero, J., Payeras, M., Ramis, J., Rodriguez-Navas, G.

Year:

2010

Language:

english

File:

PDF, 1.29 MB

english, 2010

34

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Critical charge characterization in 6-T SRAMs during read mode

Bota, Sebastia, Torrens, Gabriel, Alorda, Bartomeu

Year:

2009

File:

PDF, 1.21 MB

2009

35

[IEEE 2011 Spanish Conference on Electron Devices (CDE) - Palma de Mallorca, Spain (2011.02.8-2011.02.11)] Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 - Pass-transistors pMOS based 8T SRAM cell for layout compaction

Bota, Sebastia A., Alorda, Bartomeu, Torrens, Gabriel, Segura, Jaume

Year:

2011

Language:

english

File:

PDF, 561 KB

english, 2011

36

[IEEE 2012 IEEE 36th IEEE Annual Computer Software and Applications Conference Workshops (COMPSACW) - Izmir, Turkey (2012.07.16-2012.07.20)] 2012 IEEE 36th Annual Computer Software and Applications Conference Workshops - Understanding the Role of Transmission Power in Component-Based Architectures for Adaptive WSN

Rodriguez-Navas, Guillermo, Ribot, Miquel A., Alorda, Bartomeu

Year:

2012

Language:

english

File:

PDF, 482 KB

english, 2012

37

[IEEE Comput. Soc 9th International IEEE On-Line Testing Symposium - Kos Island, Greece (7-9 July 2003)] 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. - An evaluation of built-in vs. off-chip strategies for online transient current testing

Alorda, B., Segura, J.

Year:

2003

Language:

english

File:

PDF, 685 KB

english, 2003

38

[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - A BIST-based charge analysis for embedded memories

Alorda, B., Canals, V., de Paul, I., Segura, J.

Year:

2004

Language:

english

File:

PDF, 596 KB

english, 2004

39

[IEEE 2012 IEEE Global Engineering Education Conference (EDUCON) - Marrakech, Morocco (2012.04.17-2012.04.20)] Proceedings of the 2012 IEEE Global Engineering Education Conference (EDUCON) - Multi-subject Project Based Learning initiative

Alorda, B., Verd, J., Canals, V., Suenaga, K., Martinez, V.

Year:

2012

Language:

english

File:

PDF, 523 KB

english, 2012

40

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs

Alorda, B, Torrens, G, Bota, S, Segura, J

Year:

2010

Language:

english

File:

PDF, 567 KB

english, 2010

41

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - A CMOS integrated system for SEE-induced transients acquisition

Bota, S. A., Merino, J. L., Alorda, B., Verd, J., Torrens, G., Segura, J.

Year:

2009

File:

PDF, 518 KB

2009

42

[IEEE Comput. Soc 19th IEEE VLSI Test Symposium. VTS 2001 - Marina Del Rey, CA, USA (29 April-3 May 2001)] Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 - Defect oriented fault diagnosis for semiconductor memories using charge analysis: theory and experiments

de Paul, I., Rosales, M., Alorda, B., Segura, J., Hawkins, C., Soden, J.

Year:

2001

Language:

english

File:

PDF, 498 KB

english, 2001

43

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Alpha-SER determination from word-line voltage margin (WVM) measurements: Design architecture and experimental results

Torrens, Gabriel, de Paul, Ivan, Alorda, Bartomeu, Bota, Sebastia, Segura, Jaume

Year:

2013

Language:

english

File:

PDF, 1.51 MB

english, 2013

44

[IEEE 2011 Design, Automation & Test in Europe - Grenoble (2011.03.14-2011.03.18)] 2011 Design, Automation & Test in Europe - Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation

Alorda, B, Torrens, G, Bota, S, Segura, J

Year:

2011

Language:

english

File:

PDF, 788 KB

english, 2011

45

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications

Alorda, B., Carmona, C., Bota, S.

Year:

2014

Language:

english

File:

PDF, 1.51 MB

english, 2014

46

[IEEE 2014 5th European Workshop on CMOS Variability (VARI) - Palma de Mallorca, Spain (2014.9.29-2014.10.1)] 2014 5th European Workshop on CMOS Variability (VARI) - SRAM write margin cell estimation using wordline modulation and read/write operations

Carmona, C., Torrens, G., Alorda, B.

Year:

2014

Language:

english

File:

PDF, 3.82 MB

english, 2014

47

Collaborative distributed sun-tracking control system for building integration with minimal plant area and maximum energy-conversion efficiency

Alorda, B., Pujol-Nadal, R., Rodriguez-Navas, G., Moià-Pol, A., Martínez-Moll, V.

Journal:

International Journal of Electrical Power & Energy Systems

Year:

2015

Language:

english

File:

PDF, 2.14 MB

english, 2015

48

Transient current off-chip sensor circuit for digital IC production testing

Alorda, B., Bloechel, B., Keshavarzi, A., Segura, J.

Journal:

Electronics Letters

Year:

2002

Language:

english

File:

PDF, 172 KB

english, 2002

49

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Chardin: an off-chip transient current monitor with digital interface for production testing

Alorda, B., Bloechel, B., Keshavarzi, A., Segura, J.

Year:

2003

Language:

english

File:

PDF, 748 KB

english, 2003

50

SPIE Proceedings [SPIE SPIE Europe Microtechnologies for the New Millennium - Dresden, Germany (Monday 4 May 2009)] VLSI Circuits and Systems IV - Analysis of current transients in SRAM memories for single event upset detection

Torrens, G., Riesgo, Teresa, de la Torre, Eduardo, Bota, S., Verd, J., Soares Indrusiak, Leandro, Alorda, B., Merino, J., Segura, J.

Year:

2009

Language:

english

File:

PDF, 636 KB

english, 2009

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